Goto

Collaborating Authors

 kernel stein test


Kernel Stein Tests for Multiple Model Comparison

Neural Information Processing Systems

We address the problem of non-parametric multiple model comparison: given $l$ candidate models, decide whether each candidate is as good as the best one(s) or worse than it. We propose two statistical tests, each controlling a different notion of decision errors. The first test, building on the post selection inference framework, provably controls the number of best models that are wrongly declared worse (false positive rate). The second test is based on multiple correction, and controls the proportion of the models declared worse but are in fact as good as the best (false discovery rate). We prove that under appropriate conditions the first test can yield a higher true positive rate than the second. Experimental results on toy and real (CelebA, Chicago Crime data) problems show that the two tests have high true positive rates with well-controlled error rates. By contrast, the naive approach of choosing the model with the lowest score without correction leads to more false positives.


Kernel Stein Tests for Multiple Model Comparison

Neural Information Processing Systems

We address the problem of non-parametric multiple model comparison: given l candidate models, decide whether each candidate is as good as the best one(s) or worse than it. We propose two statistical tests, each controlling a different notion of decision errors. The first test, building on the post selection inference framework, provably controls the number of best models that are wrongly declared worse (false positive rate). The second test is based on multiple correction, and controls the proportion of the models declared worse but are in fact as good as the best (false discovery rate). We prove that under appropriate conditions the first test can yield a higher true positive rate than the second.


A kernel Stein test of goodness of fit for sequential models

arXiv.org Artificial Intelligence

We propose a goodness-of-fit measure for probability densities modeling observations with varying dimensionality, such as text documents of differing lengths or variable-length sequences. The proposed measure is an instance of the kernel Stein discrepancy (KSD), which has been used to construct goodness-of-fit tests for unnormalized densities. The KSD is defined by its Stein operator: current operators used in testing apply to fixed-dimensional spaces. As our main contribution, we extend the KSD to the variable-dimension setting by identifying appropriate Stein operators, and propose a novel KSD goodness-of-fit test. As with the previous variants, the proposed KSD does not require the density to be normalized, allowing the evaluation of a large class of models. Our test is shown to perform well in practice on discrete sequential data benchmarks.


Kernel Stein Tests for Multiple Model Comparison

Neural Information Processing Systems

We address the problem of non-parametric multiple model comparison: given $l$ candidate models, decide whether each candidate is as good as the best one(s) or worse than it. We propose two statistical tests, each controlling a different notion of decision errors. The first test, building on the post selection inference framework, provably controls the number of best models that are wrongly declared worse (false positive rate). The second test is based on multiple correction, and controls the proportion of the models declared worse but are in fact as good as the best (false discovery rate). We prove that under appropriate conditions the first test can yield a higher true positive rate than the second.